Developing High Resolution Electrical Probing System Based on Atomic Force Microscopy

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Chen Y, Wang L, He HX, Liu ZF. Developing High Resolution Electrical Probing System Based on Atomic Force Microscopy. Molecular Crystals and Liquid Crystals. 1997; 294(1):91-94.

1997
https://researcherprofiles.org/profile/1331367

Chen Y, Wang L, He HX, Liu ZF